BEGIN:VCALENDAR METHOD:PUBLISH PRODID:-//Apple Computer\, Inc//iCal 1.0//EN X-WR-CALNAME;VALUE=TEXT:USC VERSION:2.0 BEGIN:VEVENT DESCRIPTION:Speaker: Dr. Rohit Kapur, Synopsys Talk Title: The Maturing of Scan Compression Technology Abstract: The topic is IC testing. In the year 2000 scan technology went through a complete overhaul and complex IP was inserted in the scan chains to control the cost of test. The new architectures now go under the name scan compression where a few inputs and outputs are used to feed test data to the ICs that have many internal scan chains. The presenter will give a historical perspective of scan compression technology before describing one of the latest architectures being developed at Synopsys today. Biography: Rohit Kapur is an IEEE Fellow and a Scientist at Synopsys. At Synopsys he has been the inventor of many technologies including the ones delivered by Synopsys for Scan Compression. Rohit is known for his work in CTL an IEEE standard, and he currently chairs all the standard activities in test within IEEE. Host: Prof. Sandeep Gupta SEQUENCE:5 DTSTART:20140307T110000 LOCATION:EEB 110 DTSTAMP:20140307T110000 SUMMARY:The Maturing of Scan Compression Technology UID:EC9439B1-FF65-11D6-9973-003065F99D04 DTEND:20140307T120000 END:VEVENT END:VCALENDAR