Overheating in devices such as smarphones and laptops is a common problem, but not an easy one to fix. Until recently, attempts at measuring and managing the temperature of microelectronics have been a conundrum because any tools used in the process always added their own heat to the equation. A research team led by Matthew Mecklenburg at the USC Center for Electron Microscopy and Microanalysis (CEMMA) has now developed a new technique to measure actual temperatures within microelectronic devices.
Below is a sampling of recent of media articles about this research.
 |
Overheating is a major problem for the microprocessors that run our smartphones and computers. But a team of UCLA and USC scientists have made a breakthrough that should enable engineers to design microprocessors that minimize that problem: They have developed a thermal imaging technique that can "see" how the temperature changes from point to point inside the smallest electronic circuits. (View article) |
 |
Researchers have developed a new temperature mapping technology for tiny devices that could help solve the problem of overheating in smartphones and computers. (View article) |
 |
Researchers from the University of Southern California say they have made a major step forward in understanding temperatures in microelectronic devices. (View article) |
 |
We know that electronic components get hot, but understanding the fine detail of heat in a circuit feature measuring nanometers is difficult. Infrared imaging relies on wavelengths that are bigger than the features involved, leading to low resolution. Touching a spot with a (tiny) thermometer is high resolution, but its accuracy suffers because some of the heat leaks into the instrument. (View article) |
 |
Overheating is a major problem for the microprocessors that run our smartphones and computers. But a team of UCLA and USC scientists have made a breakthrough that should enable engineers to design microprocessors that minimize that problem: They have developed a thermal imaging technique that can "see" how the temperature changes from point to point inside the smallest electronic circuits. (View article) |
 |
Overheating is a major problem for the microprocessors that run our smartphones and computers. But a team of UCLA and USC scientists have made a breakthrough that should enable engineers to design microprocessors that minimize that problem: They have developed a thermal imaging technique that can “see” how the temperature changes from point to point inside the smallest electronic circuits. (View article)
|
 |
A team of USC and UCLA students, professors and scientists has discovered advancements in thermal management of microelectronic devices such as cellphones and laptops. On Feb. 6, both universities released a paper in Science to discuss advancements found in their research on heat control of devices. (View article) |
