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Events for May 01, 2009

  • Senior Design Expo

    Fri, May 01, 2009 @ 01:30 PM - 04:00 PM

    Viterbi School of Engineering Student Affairs

    Student Activity


    The Senior Design Expo will showcase various projects Viterbi seniors have completed in their capstone classes. Students and faculty will have the opportunity to vote for their favorite project!

    Location: Engineering Quad

    Audiences: Undergraduate Students, Staff & Faculty

    Contact: KIUEL

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  • Evaluation of Human Brain MRI Registration Algorithms

    Fri, May 01, 2009 @ 02:30 PM - 03:30 PM

    Ming Hsieh Department of Electrical and Computer Engineering

    Conferences, Lectures, & Seminars


    Speaker: Arno Klein,
    Assistant Professor of Clinical Neurobiology,
    Columbia UniversityAbstract: All fields of neuroscience that employ brain imaging need to communicate their results with reference to anatomical regions. Inparticular, comparative morphometry and group analysis of functionaland physiological data require coregistration of brains to establishcorrespondences across brain structures. It is well established thatlinear registration of one brain to another is inadequate for aligning brain structures,so numerous algorithms have emerged to nonlinearly register brains to one another. This study is the largest evaluation of nonlinear deformation algorithms applied to brain image registration ever conducted. Fourteen algorithms from laboratories around the world are evaluated using 8 different error measures. Morethan 45,000 registrations between 80 manually labeled brains were performed by algorithms including: AIR, ANIMAL, ART, Diffeomorphic Demons, FNIRT, IRTK, JRD-fluid, ROMEO, SICLE, SyN, and four different SPM5 algorithms ("SPM2-type" and regular Normalization, Unified Segmentation, and the DARTEL Toolbox). All of these registrations were preceded by linear registration between the same image pairs using FLIRT. One of the most significant findings of this study is that the relative performances of the registration methods under comparison appear to be little affected by the choice of subject population, labeling protocol, and type of overlap measure. This is important because it suggests that the findings are generalizable to new subject populations that are labeled or evaluated using different labeling protocols. Furthermore, we ranked the 14 methods according to three completely independent analyses (permutation tests, one-way ANOVA tests, and indifference-zone ranking) and derived three almost identical top rankings of the methods. ART, SyN, IRTK, and SPM's DARTEL Toolbox gave the best results according to overlap and distance measures, with ART and SyN delivering the most consistently high accuracy across subjects and label sets. Updates will be published on the http://www.mindboggle.info/papers/ website.Hosted by Professor Richard Leahy

    Location: Hughes Aircraft Electrical Engineering Center (EEB) - 248

    Audiences: Everyone Is Invited

    Contact: Talyia Veal

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