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The Maturing of Scan Compression Technology
Fri, Mar 07, 2014 @ 11:00 AM - 12:00 PM
Ming Hsieh Department of Electrical and Computer Engineering
Conferences, Lectures, & Seminars
Speaker: Dr. Rohit Kapur, Synopsys
Talk Title: The Maturing of Scan Compression Technology
Abstract: The topic is IC testing. In the year 2000 scan technology went through a complete overhaul and complex IP was inserted in the scan chains to control the cost of test. The new architectures now go under the name scan compression where a few inputs and outputs are used to feed test data to the ICs that have many internal scan chains. The presenter will give a historical perspective of scan compression technology before describing one of the latest architectures being developed at Synopsys today.
Biography: Rohit Kapur is an IEEE Fellow and a Scientist at Synopsys. At Synopsys he has been the inventor of many technologies including the ones delivered by Synopsys for Scan Compression. Rohit is known for his work in CTL an IEEE standard, and he currently chairs all the standard activities in test within IEEE.
Host: Prof. Sandeep Gupta
Location: Hughes Aircraft Electrical Engineering Center (EEB) - 110
Audiences: Everyone Is Invited
Contact: Annie Yu
