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Materials Science Seminar
Fri, Oct 15, 2004 @ 02:45 PM - 04:00 PM
Mork Family Department of Chemical Engineering and Materials Science
Conferences, Lectures, & Seminars
Scott Sitzman
Applications Scientist / Western Regional Sales and Applications
HKL Technology, Inc.Speaks on:Electron BackScatter Diffraction (EBSD) in the SEM for characterization of metal, ceramic and mineral microstructuresAbstract:Electron BackScatter Diffraction is a rapidly growing SEM-based technique in materials characterization, used to analyze crystalline solids for crystallographic orientation/texture, grain size and shape, grain boundary character, state of strain, and crystallography-based phase identification. This talk will introduce the technique, discuss modes of sampling and analysis, describe the latest capabilities on modern SEMs and SEM-FIB instruments, and give applications examples in metallurgy and ceramics.Refreshments will be served at 2:30p.m.**ALL FIRST-YEAR MATERIALS SCIENCE GRADUATE STUDENTS ARE REQUIRED TO ATTEND**Location: Vivian Hall of Engineering (VHE) - 217
Audiences: Everyone Is Invited
Contact: Petra Pearce
