Events Calendar

Automatic Modulation Classification

Speaker: Professor A. K. Nandi, The University of Liverpool, Liverpool, United Kingdom

Talk Title: Automatic Modulation Classification

Abstract: Automatic modulation classification (AMC) attempts to determine the modulation of a received radio signal in the baseband. This has civil and military as well as covert and overt applications. For example, AMC is an essential part of a software defined radio (SDR) system. There has been a long tradition of various research directions in AMC. Most of the methods fall into two approaches. One is called decision theoretic; the maximum likelihood is one such approach when one knows the underlying probability density distribution. It can also be regarded as a classification problem and machine-learning methods can be adapted as long as one discovers some useful features. In this seminar I shall present the nature of the problem, offer some existing ways to explore it, and review some of the results obtained so far. It is still a topic of current interest.

Biography: Professor Asoke K. Nandi received the degree of Ph.D. from the University of Cambridge (Trinity College), Cambridge, U.K., in 1979. Since March 1999 he has been at the University of Liverpool and holds the David Jardine Chair of Signal Processing. Currently, he is interested in the areas of machine learning for signal processing, evolutionary algorithms, signal classification, bio-medical signal processing, and communications research. He has authored or co-authored over 400 technical publications, including two books and over 170 journal papers. Professor Nandi is a Fellow of the Cambridge Philosophical Society, the Institution of Engineering and Technology, the Institute of Mathematics and its Applications, the Institution of Mechanical Engineers, the Institute of Physics, the Royal Society for Arts, and the British Computer Society.


Host: Professor Sanjit Mitra

Location: Hughes Aircraft Electrical Engineering Center (EEB) - EEB 248

Audiences: Everyone Is Invited

Contact: Talyia Veal