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CMOS Process Variations: A “Critical Operation Point” Hypothesis
Thu, May 03, 2012 @ 11:00 AM - 12:00 PM
Ming Hsieh Department of Electrical and Computer Engineering
Conferences, Lectures, & Seminars
Speaker: Janak H. Patel, University of Illinois at Urbana-Champaign
Talk Title: CMOS Process Variations: A âCritical Operation Pointâ Hypothesis
Abstract: A brief overview of present and future CMOS process variations will be presented. Prevailing understanding of a chipâs behavior under large process variations with statistical delay assumptions leads one to conclude that a small number of errors are likely as we progress further down on Mooreâs Law. This understanding is challenged by a new hypothesis on the behavior of very large CMOS chips in the presence of process variations. A Thought Experiment is presented which leads to the new hypothesis. The new hypothesis states that in every large CMOS chip, there exist critical operations points (frequency, voltage, temperature) such that it divides the 3-D space (F, V, T) in to two distinct spaces: 1. Error-free operation and 2. Massive errors (i.e. completely inoperable). Two attempts at disproving this hypothesis with real physical experiments will be described. Some consequences of the hypothesis on power savings in large data centers are also suggested.
Biography: Janak H. Patel is a Research Professor in Coordinated Science Laboratory and Department of Electrical and Computer Engineering at University of Illinois at Urbana-Champaign.
Patelâs research contributions include Pipeline Scheduling, Cache Coherence, Cache Simulation, Interconnection Networks, On-line Error Detection, Reliability analysis of memories with ECC and scrubbing, Design for Testability, Built-In Self-Test, Fault Simulation and Automatic Test Generation. Patel has supervised over 85 M.S. and Ph.D. theses and published over 200 technical papers and listed as a Highly Cited Researcher. He was a founding technical advisor to Nexgen Microsystems that gave rise to the entire line of microprocessors from AMD. He was a founder of successful startup, Sunrise Test, a CAD company for chip testing, now owned by Synopsys.
He received a Bachelor of Science degree in Physics from Gujarat University, India and Bachelor of Technology in Electrical Engineering from the Indian Institute of Technology, Madras, India, and a Master of Science and Ph.D. in Electrical Engineering from Stanford University. He is a fellow of ACM and IEEE and a recipient of the 1998 IEEE Piore Award.
Host: Melvin A. Breuer
Location: Hughes Aircraft Electrical Engineering Center (EEB) - 248
Audiences: Everyone Is Invited
Contact: Annie Yu