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Events for January 12, 2006
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Lyman Handy Colloquium
Thu, Jan 12, 2006 @ 12:30 PM
Mork Family Department of Chemical Engineering and Materials Science
Conferences, Lectures, & Seminars
Aberration Corrected Electron Microscopy: What are the New Perspectives for Materials Sciences?Dr. C. Kisielowski
National Center for Electron Microscopy, LBNL
Berkeley CA ABSTRACT Ongoing technological advancements of electron microscopy will reshape the way electron scattering is utilized to investigate structure and composition of materials down to the atomic level. It foreseeable (and partly established) that electron microscopes will have the ability to image single atoms of most elements of the periodic table of elements and to tie the spatial information to spectroscopy, which probes for chemical constituents and local bonding. Therefore, a three-dimensional materials characterization can reach towards atomic resolution and it is feasible to solve the long-standing problem of information loss that comes from projecting the 3D materials structure into a 2D image plane.
This talk highlights how much materials science already benefits from recent advancement of instrumentation. Application examples include a characterization of a dislocation in GaAs in terms of displacement fields and impurity segregation, investigations of strain relaxation processes in FePt nanoparticles, and investigations of local band gap fluctuations that are induced by indium clusters in GaN/InGaN/GaN quantum wells. The given examples also point to current limitations that will be removed by the next generation of fully aberration corrected microscopes, which are currently developed within the DoE s TEAM-Project.Thursday, January 12, 2006
Seminar at 12:30 p.m. - OHE 122
Refreshments served after the seminar in HED Lobby
The Scientific Community is Cordially Invited
Location: Olin Hall of Engineering (OHE) - 122
Audiences: Everyone Is Invited
Contact: Petra Pearce
