Microstructure as Derived from X-Ray Line Broadening

Tamás Ungár Professor Department Materials Physics Eötvös University Budapest, Hungary X-ray diffraction peaks broaden either when crystallites become small or if the crystal is distorted by lattice defects. Size broadening is independent of diffraction order, however, strain broadening increases with diffraction order. Planar defects, especially stacking faults or twin boundaries produce a mixture of size and strain. hkl dependence of the different microstructure features can be very different allowing separation. A brief summary of the principles and specific case studies will be presented for nanomaterials and conventional grain size structural materials, including the effect of twinning in hexagonal metals.

Location: Seaver Science Library (SSL) - Rm 150

Audiences: Everyone Is Invited

Contact: April Mundy