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Measurement, Modeling and Rendering for Realistic Computer Graphics
Wed, Mar 11, 2009 @ 10:30 AM - 11:30 AM
Thomas Lord Department of Computer Science
Conferences, Lectures, & Seminars
Speaker: Dr. Abhijeet Ghosh, ICT, USC
Host: Prof. Shahram GhandeharizadehAbstract:
Throughout its history, the field of computer graphics has been striving towards increased realism. Photo-realistic image synthesis has traditionally involved the development of algorithms for the simulation of physically accurate light transport in a scene. However, the quality of rendering produced by these algorithms is limited by the quality of the input scene descriptions such as materials and illumination models. With the advances within the field of digital photography over the last decade, there has been significant interest in acquiring material and illumination models from photographs. This acquisition method has led to the development of image-based modeling and rendering techniques for realistic computer graphics.In this talk, I will present a set of new techniques for efficient acquisition and modeling of reflectance properties of real world materials and human faces, as well as new algorithms for high quality rendering with acquired data. In particular, I will describe a novel high speed approach for the acquisition of bidirectional reflectance distribution functions (BRDFs) of materials by projecting basis illumination, and a technique for practical modeling and rapid measurement of layered facial reflectance using a few controlled lighting conditions. Here, I will discuss some approaches for separation of individual reflectance components and fitting measured data to appropriate reflectance and scattering models. I will also touch upon rendering techniques for such measured data. In particular, I will present some Monte Carlo strategies for efficient sampling of static as well as dynamic environmental illumination, as well techniques for efficient rendering of layered subsurface scattering.Location: Henry Salvatori Computer Science Center (SAL) - 222
Audiences: Everyone Is Invited
Contact: CS Colloquia