Seminar: Design-for-reliability for scaled electronic technologies: Opportunities and challenges

Abstract: This talk will motivate design-for-reliability initiatives that anticipate the paradigm shift to error-aware and error-tolerant design of integrated circuits, both of which are required to address the problem of increasing hardware failures in future technology nodes. These concerns are only
exacerbated as we look forward to emerging technology alternatives. Using graphene as an example, I will go on to describe the modeling, simulation, and design advances that we believe are essential to
address the complexity challenges associated with such scaled electronic technologies.Bio: Kartik Mohanram received the B.Tech. degree in electrical engineering from IIT-Bombay in 1998, and the M.S. and Ph.D. degrees in computer engineering from UT-Austin in 2000 and 2003 respectively. He is currently an assistant professor in the department of Electrical and Computer Engineering at Rice University. His primary research interests are in computer engineering and systems, with an emphasis on modeling, simulation, and computer-aided design of integrated circuits. He is a
recipient of the NSF CAREER Award, the ACM/SIGDA Technical Leadership Award, and the A. Richard Newton Graduate Scholarship.

Location: Ronald Tutor Hall of Engineering (RTH) - 306

Audiences: Everyone Is Invited

Contact: Annie Yu