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Events for May 03, 2012
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Six Sigma Black BeltThu, May 03, 2012 @ 09:00 AM - 05:00 PM
Executive Education
Conferences, Lectures, & Seminars
Speaker: Larry Aft, Professional Programs
Talk Title: Six Sigma Black Belt
Abstract: Course Overview
This course teaches you the advanced problem-solving skills you'll need in order to measure a process, analyze the results, develop process improvements and quantify the resulting savings. Project assignments between sessions require you to apply what youâve learned. This course is presented in the classroom in three five-day sessions over a three-month period.
Learn the advanced problem-solving skills you need to implement the principles, practices and techniques of Six Sigma to maximize performance and cost reductions in your organization. During this three-week practitioner course, you will learn how to measure a process, analyze the results, develop process improvements and quantify the resulting savings. You will be required to complete a project demonstrating mastery of appropriate analytical methods and pass an examination to earn IIEâs Six Sigma Black Belt Certificate.This practitioner course for Six Sigma implementation provides extensive coverage of the Six Sigma process as well as intensive exposure to the key analytical tools associated with Six Sigma, including project management, team skills, cost analysis, FMEA, basic statistics, inferential statistics, sampling, goodness of fit testing, regression and correlation analysis, reliability, design of experiments, statistical process control, measurement systems analysis and simulation. Computer applications are emphasized.
NOTE: Participants must bring a laptop computer running Microsoft Office® to the seminar.
Course Topics
* Business process management
* Computer applications
* Design of experiments (DOE)
* Design for Six Sigma (DFSS)
* DMAIIC
* Enterprisewide deployment
* Lean enterprise
* Project management
* Regression and correlation modeling
* Statistical methods and sampling
* Statistical process control
* Team processes
Benefits
Upon completion of this course, you will be able to:
* Analyze process data using comprehensive statistical methods
* Control the process to assure that improvements are used and the benefits verified
* Define an opportunity for improving customer satisfaction
* Implement the recommended improvements
* Improve existing processes by reducing variation
* Measure process characteristics that are critical to quality
Who Should Attend
* VPs, COOs, CEOs
* Employees new to a managerial position
* Employees preparing to make the transition to managerial roles
* Current managers wanting to hone leadership skills
* Anyone interested in implementing Lean or Six Sigma in their organization
Program Fees
On-Campus Participants: $6095
Includes continental breakfasts, lunch and all course materials. The fee does not include hotel accommodations or transportation.
Online Participant with Live Session Interactivity: $6095
Includes attendee access codes for live call-in or chat capabilities during class sessions. Also includes all course and lecture materials available for live stream or download.
Reduced Pricing:
Institute of Industrial Engineers (IIE): Reduced pricing is available for members of IIE. Please contact professional@mapp.usc.edu for further information.
Trojan Family: USC alumni, current students, faculty, and staff receive 10% reduced pricing on registration.
Boeing: Boeing employees receive 20% off registration fees (please use Boeing email address when registering).
Location
Two course delivery options are available for participants, on-campus and online with interactivity:
On-Campus Course is held in state-of-the-art facilities on the University of Southern California campus, located in downtown Los Angeles. Participants attending on-campus will have the option to commute to the course or stay at one of the many hotels located in the area. For travel information, please visit our Travel section.
Overview of on-campus option:
* The ability to interact with faculty and peers in-person.
* Access to hard copy course materials.
* Ability to logon and view archived course information - up to 7 days after the course has been offered. This includes course documents and streaming video of the lectures.
* If there is a conflict during any on-campus course dates, on-campus participants can elect to be an online/interactive student.
* Parking, refreshments and lunch are provided for on-campus participants â unless otherwise specified.
Online (Interactivity) Course delivery is completely online and real-time, enabling interaction with the instructor and fellow participants. Participants have the flexibility of completing the course from a distance utilizing USC's Distance Education Network technology. Students are required to be online for the entirety of each day's session.
Overview of online (interactive):
* Virtually participate in the course live â with the ability to either ask questions or chat questions to the entire class.
* WebEx technologies provide the option to call into the class and view the entire lecture/materials on a personal computer, or to participate on a computer without having to utilize a phone line.
* Ability to logon and view archived course information up to 7 days after the course has been offered. This includes course documents and streaming video of the lectures.
Continuing Education Units
CEUs: 10.5 (CEUs provided by request only)
USC Viterbi School of Engineering Certificate of Participation is awarded to all participants upon successful completion of course.
Upon completion, participants will also receive their Institute of Industrial Engineers certification in SIx Sigma Black Belt.
Host: Professional Programs
Audiences: Registered Attendees
Contact: Viterbi Professional Programs
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CMOS Process Variations: A “Critical Operation Point” Hypothesis
Thu, May 03, 2012 @ 11:00 AM - 12:00 PM
Ming Hsieh Department of Electrical and Computer Engineering
Conferences, Lectures, & Seminars
Speaker: Janak H. Patel, University of Illinois at Urbana-Champaign
Talk Title: CMOS Process Variations: A âCritical Operation Pointâ Hypothesis
Abstract: A brief overview of present and future CMOS process variations will be presented. Prevailing understanding of a chipâs behavior under large process variations with statistical delay assumptions leads one to conclude that a small number of errors are likely as we progress further down on Mooreâs Law. This understanding is challenged by a new hypothesis on the behavior of very large CMOS chips in the presence of process variations. A Thought Experiment is presented which leads to the new hypothesis. The new hypothesis states that in every large CMOS chip, there exist critical operations points (frequency, voltage, temperature) such that it divides the 3-D space (F, V, T) in to two distinct spaces: 1. Error-free operation and 2. Massive errors (i.e. completely inoperable). Two attempts at disproving this hypothesis with real physical experiments will be described. Some consequences of the hypothesis on power savings in large data centers are also suggested.
Biography: Janak H. Patel is a Research Professor in Coordinated Science Laboratory and Department of Electrical and Computer Engineering at University of Illinois at Urbana-Champaign.
Patelâs research contributions include Pipeline Scheduling, Cache Coherence, Cache Simulation, Interconnection Networks, On-line Error Detection, Reliability analysis of memories with ECC and scrubbing, Design for Testability, Built-In Self-Test, Fault Simulation and Automatic Test Generation. Patel has supervised over 85 M.S. and Ph.D. theses and published over 200 technical papers and listed as a Highly Cited Researcher. He was a founding technical advisor to Nexgen Microsystems that gave rise to the entire line of microprocessors from AMD. He was a founder of successful startup, Sunrise Test, a CAD company for chip testing, now owned by Synopsys.
He received a Bachelor of Science degree in Physics from Gujarat University, India and Bachelor of Technology in Electrical Engineering from the Indian Institute of Technology, Madras, India, and a Master of Science and Ph.D. in Electrical Engineering from Stanford University. He is a fellow of ACM and IEEE and a recipient of the 1998 IEEE Piore Award.
Host: Melvin A. Breuer
Location: Hughes Aircraft Electrical Engineering Center (EEB) - 248
Audiences: Everyone Is Invited
Contact: Annie Yu
