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SUNMONTUEWEDTHUFRISAT
Events for November 05, 2012
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Meet USC: Admission Presentation, Campus Tour, & Engineering TalkMon, Nov 05, 2012
Viterbi School of Engineering Undergraduate Admission
Receptions & Special Events
This half day program is designed for prospective freshmen and family members. Meet USC includes an information session on the University and the Admission process; a student led walking tour of campus and a meeting with us in the Viterbi School. Meet USC is designed to answer all of your questions about USC, the application process and financial aid. Reservations are required for Meet USC. This program occurs twice, once at 8:30 a.m. and again at 12:30 p.m. Please visit https://esdweb.esd.usc.edu/unresrsvp/MeetUSC.aspx to check availability and make an appointment. Be sure to list an Engineering major as your "intended major" on the webform!
Location: Ronald Tutor Campus Center (TCC) -
Audiences: Prospective Freshmen Students and Families
Contact: Viterbi Admission
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Student Seminar Series
Mon, Nov 05, 2012 @ 12:00 PM - 02:00 PM
Ming Hsieh Department of Electrical and Computer Engineering
University Calendar
The Student Seminar Series will allow students to practice their research talks by presenting to one another. Ph.D. students will present their research to fellow Ph.D. students at each seminar session, and each student will be able to gain feedback from their peers.
The MHI Ph.D. Scholars will give presentations at the 1st Student Seminar Series event on 11/5 and explain the structure. Then students could sign up for student seminars, which will be bi-weekly.
Invited: Electrical Engineering Ph.D. students (student organized event)
11/5 Presentation:
Speaker: Osonde Osoba, Electrical Engineering Ph.D. student
Talk Title: Noisy Expectation-Maximization and Some Applications
Talk Abstract: The expectation-maximization (EM) algorithm is an iterative maximum-likelihood estimation scheme for corrupted data. Many generic statistical estimation methods are EM algorithms in disguise. I will talk about the Noisy Expectation-Maximization (NEM) algorithm. This is a modification of the EM scheme that achieves faster average convergence times than the regular EM algorithm. I will describe the theory behind the NEM algorithm. Then I will talk about some of the applications of the NEM algorithm.
Refreshments will be provided
https://mhi.usc.edu/events/event-details/?event_id=899645
More Information: 11 5 12 seminar (2).pdf
Location: Hughes Aircraft Electrical Engineering Center (EEB) - 248
Audiences: EE PhD students & postdocs
Contact: Danielle Hamra
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Seminar in Biomedical Engineering
Mon, Nov 05, 2012 @ 12:30 PM - 01:50 PM
Alfred E. Mann Department of Biomedical Engineering
Conferences, Lectures, & Seminars
Speaker: Meng Law, M.D., Radiology, Keck School of Medicine
Talk Title: Neuroimaging in Alzheimerâs Disease: Novel Insights into Cause and Cure
Biography: Dr. Meng Lawâs focus is on neuroradiology and his recent research includes, "contrast media in MR imaging," "applications of diffusion-tensor imaging," "enhancing neuroimaging with nanotechnology," and "PET/MRI fusion."
Host: BME
Location: Olin Hall of Engineering (OHE) - 122
Audiences: Everyone Is Invited
Contact: Mischalgrace Diasanta
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Yield improvement and test cost reduction for TSV based 3D stacked ICs
Mon, Nov 05, 2012 @ 01:30 PM - 02:30 PM
Ming Hsieh Department of Electrical and Computer Engineering
Conferences, Lectures, & Seminars
Speaker: Dr. Said Hamdioui, Delft University of Technology
Talk Title: Yield improvement and test cost reduction for TSV based 3D stacked ICs
Abstract: The industry is preparing itself for three-dimensional stacked ICs (3D-SICs), vertically interconnected by means of Through-Silicon Viaâs (TSVs). 3D-SIC is an emerging technology that promises huge advantages such as heterogeneous integration with higher performance and lower power dissipation at a smaller footprint. However, for 3D integration to become a viable product approach, many challenges have to be solved including design, manufacturing and test. The talk will provide first an overview about the opportunities and challenges of 3D-SICs. Thereafter, some major challenges such as yield improvement, test cost reduction and reliability will be addressed in more details. Compound yield is a major concern for Wafer-to-Wafer 3D stacking (used for e.g. dies with similar size such as memories), especially for higher number stacked dies. 3D-SIC test needs complex test flow trade-offs due to e.g. huge different test moments (e.g., pre-bond test, mid-bond test, final test). Finally, Reliability is another concerns that may be caused due to wafer thinning, TSV processing, thermal and mechanical stress, etc.
Biography: Hamdioui (http://www.ce.ewi.tudelft.nl/hamdioui/) received the MSEE and PhD degrees (both with honors) from the Delft University of Technology (TUDelft), Delft, The Netherlands. He is currently co-leading dependable-nano computing research activities within the Computer Engineering Laboratory of TUDelft. Prior to joining TUDelft, Hamdioui worked for Intel Corporation (CA, USA), Philips Semiconductors R&D (France) and for Philips/ NXP Semiconductors (Nijmegen, The Netherlands). His research interests include dependable nano-computing and VLSI Design & Test (defect/fault tolerance, reliability, hardware security, Design-for-Testability, Built-In-Self-Test, 3D stacked IC test, memory test, defect oriented test, etc.).
Host: Prof. Sandeep Gupta
Location: Hughes Aircraft Electrical Engineering Center (EEB) - 349
Audiences: Everyone Is Invited
Contact: Annie Yu
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Mathematics Department Seminar
Mon, Nov 05, 2012 @ 03:30 PM - 05:00 PM
Daniel J. Epstein Department of Industrial and Systems Engineering
Conferences, Lectures, & Seminars
Speaker: Christine Shoemaker, Joseph P. Ripley Professor, School of Civil and Environmental Engineering & School of Operations Research and Information Engineering, Cornell University
Talk Title: "Surrogate Surface Algorithms for Nonlinear and Global Optimization and Uncertainty Analysis of Computationally Expensive Simulation Models"
Abstract: Optimization and uncertainty analyses used in conjunction with complex simulation models are important for using models to make predictions based on observations and for finding optimal designs or policies. Often these models can generate objective function surfaces with multiple local minima. Global Optimization and uncertainty analysis typically require a very large number of simulations, often thousands or tens of thousands. However, this number of simulations is not feasible for computationally expensive nonlinear simulation models.
Our approach is to iteratively approximate the objective function or likelihood function f(x) with Radial Basis Functions (RBF) or other surrogate response surfaces during the search process. Our methods are derivative-free and can find local and global minima. It is this use of previously evaluated points f(xi) that is responsible for great savings in computational time. I will give results that compare these algorithms , including applications to complex simulations for groundwater remediation and carbon sequestration and for uncertainty quantification.
Related References:
Wild, S.M. and C.A. Shoemaker, Global Convergence of Radial Basis Functions Trust Region algorithms, SIAM Optimization Jn. , 20, 387-415, 2011
Regis, R.G., C.A. Shoemaker, âParallel Stochastic Global Optimization Using Radial Basis Functions,â INFORMS Jn. of Computing, 21 (3), 411-426, 2009.
Bliznyuk, N., D. Ruppert, C. Shoemaker, â Local Derivative-Free Approach to Approximation of Computationally Expensive Posterior Densities with Application to Parameter Uncertainty for a Watershed Model, Journal of Computational and Graphical Statistics, (in press 2012)
Host: Mathematics Department
Location: Kaprielian Hall (KAP) - Room 414
Audiences: Everyone Is Invited
Contact: Georgia Lum
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NSBE General Body Meeting
Mon, Nov 05, 2012 @ 07:30 PM - 08:30 PM
Viterbi School of Engineering Student Organizations
University Calendar
During our first meeting, we will discuss the current state of affairs of USC NSBE, discuss our upcoming academic success tutorials, and help members prepare for the Regional & National Conferences. Food will be provided. **Please bring your academic schedule, as we will be making a calendar of our events.
Location: Grace Ford Salvatori Hall Of Letters, Arts & Sciences (GFS) - 118
Audiences: Everyone Is Invited
Contact: National Society of Black Engineers (NSBE)
